The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Dec. 06, 2017
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/68 (2017.01); G06T 7/00 (2017.01); G06K 9/62 (2006.01); G06T 7/254 (2017.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G06T 7/68 (2017.01); G06K 9/6203 (2013.01); G06K 9/6206 (2013.01); G06K 9/6215 (2013.01); G06T 7/0012 (2013.01); G06T 7/254 (2017.01); G06T 7/90 (2017.01); G06T 2207/10024 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30096 (2013.01);
Abstract
Asymmetries are detected in one or more images by partitioning each image to create a set of patches. Salient patches are identified, and an independent displacement for each patch is identified. The techniques used to identify the salient patches and the displacement for each patch are combined in a function to generate a score for each patch. The scores can be used to identify possible asymmetries.