The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Aug. 26, 2016
Applicants:

Olympus Corporation, Tokyo, JP;

The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);

Inventors:

Steven Paul Lansel, East Palo Alto, CA (US);

Brian A. Wandell, Stanford, CA (US);

Andy Lai Lin, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/586 (2017.01); H04N 5/225 (2006.01); H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
G06T 7/586 (2017.01); H04N 5/2256 (2013.01); H04N 5/2351 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/10152 (2013.01);
Abstract

Systems and methods for performing depth estimation may comprise: an illuminator capable of illuminating a scene from at least a first position and a second position, an image sensor to capture (i) a first image of the scene while the illuminator illuminates the scene from the first position and (ii) a second image of the scene while the illuminator illuminates the scene from the second position, and an image processor to receive the first and second images from the image sensor and estimate a depth of at least one feature that appears in the first and second images. The depth is estimated based on the relative intensity of the first image and the second image, a distance between the first illumination position and the second illumination position, and a position of the at least one feature within at least one of the first and second images.


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