The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
May. 22, 2018
Midea Group Co., Ltd., Foshan, CN;
MIDEA GROUP CO. LTD., Foshan, CN;
Abstract
A method of performing automated object inspection includes obtaining a plurality of test images. For each of the plurality of test images, the method includes performing independent object inspection on each of two or more sub-portions of the test image. The method further includes segmenting the test image into at least a first sub-portion of the test image and a second sub-portion of the test image; performing object inspection on the first sub-portion of the test image using a first subset of information channels of the test image and a first model trained on a first set of training images containing the first component; and performing object inspection on the second sub-portion of the test image using a second subset of information channels of the test image, and a second model trained on a second set of training images containing the second component.