The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Nov. 28, 2017
Henkel Ip & Holding Gmbh, Duesseldorf, DE;
Paul Kichar, Oxford, CT (US);
Maxime Pelletier, Sandy Hook, CT (US);
Michelle Avelina Piombino, West Haven, CT (US);
Joseph David Dahlmeyer, Jr., East Haven, CT (US);
Henkel IP & Holding GmbH, , DE;
Abstract
Systems and methods for analyzing stained fabric articles are provided herein. In an embodiment, a method for analyzing stained fabric articles includes providing a stained fabric article that includes a foreign oily substance disposed in and/or on the fabric article. At least one image of the stained fabric article is captured using a three-dimensional imaging device, wherein the at least one image is captured in the absence of a colored dyes added to the foreign oily substance in and/or on the fabric article. The at least one image is processed using a contrast function to produce a processed data set. One or more of a processed image or a quantitative data set that is representative of oily substance presence in the viewing area of the three-dimensional imaging device is produced based upon the processed data set.