The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Apr. 03, 2014
Koninklijke Philips N.v., Eindhoven, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
A method includes determining a low contrast detectability of a scan and generating an image quality index based on the determined low contrast detectability. Another method includes identifying an image quality index of interest, identifying an acquisition and/or reconstruction parameter based on the image quality index and a pre-determined mapping between image quality indexes and acquisition parameter and reconstruction parameters, and displaying the identified acquisition and/or the reconstruction parameter. A system () includes a metric determiner () that determines a first image quality index for a scan based on at least one of a low contrast detectability of the scan or a project domain noise of the scan, and/or a parameter recommender () that recommends at least one of an acquisition or a reconstruction parameter for a scan based on a second image quality index, and a display () that visually presents the first or second image quality index.