The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Jan. 12, 2017
Applicant:

Servicenow Inc., Santa Clara, CA (US);

Inventors:

Baskar Jayaraman, Fremont, CA (US);

Debashish Chatterjee, Fremont, CA (US);

Kannan Govindarajan, Sunnyvale, CA (US);

Ganesh Rajan, Saratoga, CA (US);

Assignee:

ServiceNow, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/02 (2006.01); G06F 16/22 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/02 (2013.01); G06F 16/22 (2019.01); G06N 20/00 (2019.01);
Abstract

A computer implemented system for automating the generation of an analytic model includes a processor configured to process a plurality of data sets. Each data set includes values for a plurality of variables. A time-stamping module is configured to derive values for a plurality of elapsed-time variables for each data set, and the plurality of variables and plurality of elapsed-time variables are included in a plurality of model variables. A model generator is configured to create a plurality of comparison analytic models each based on a different subset of model variables. Each comparison analytic model is configured to operate on new data sets associated with current leads, and to output a likelihood of successfully closing an associated transaction. A model testing module is configured to select an operational analytic model from among the comparison analytic models based on a quality metric.


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