The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Sep. 27, 2018
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Kim-Chyan Gan, Sammamish, WA (US);

Mao Zeng, Austin, TX (US);

Erich Plondke, Austin, TX (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06K 9/32 (2006.01); G06T 1/20 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4647 (2013.01); G06K 9/00986 (2013.01); G06K 9/3233 (2013.01); G06K 9/4642 (2013.01); G06K 9/4671 (2013.01); G06K 9/6206 (2013.01); G06T 1/20 (2013.01);
Abstract

A method of generating a feature descriptor includes determining a first output histogram of an input by processing a first group of pixels of the input to determine first contributions to bins of the first output histogram. The input image including gradient orientation values and gradient magnitude values of a portion of an image that is in a region of a detected feature. After processing the first group of pixels, the method includes determining a second output histogram of the input by processing a second group of pixels of the input to determine second contributions to bins of the second output histogram.


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