The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
May. 24, 2018
Hitachi, Ltd., Tokyo, JP;
Jia Li, Novi, MI (US);
Tianye Ma, Northville, MI (US);
Yuan Xiao, Northville, MI (US);
Heming Chen, Novi, MI (US);
Hitachi, Ltd., Tokyo, JP;
Abstract
In some examples, a system may receive a plurality of parameters for a filter design, including a noise parameter. The system may determine a plurality of candidate filter configurations based on at least one of the received parameters. The system may further determine, for each candidate filter configuration of the plurality of candidate filter configurations, based on a trained machine learning model, an estimated electromagnetic interference (EMI) noise associated with each candidate filter configuration. The system may select at least one of the candidate filter configurations based on the estimated EMI noise. In some cases, the system may perform a simulation using the selected candidate filter configuration. Based on the results of the selecting and/or the simulation, the system may send information related to the at least one selected candidate filter configuration to a computing device.