The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10706188 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 07, 2020

Filed:

Nov. 10, 2016
Applicant:

Educational Testing Service, Princeton, NJ (US);

Inventor:

Matthias von Davier, Lawrenceville, NJ (US);

Assignee:

Educational Testing Service, Princeton, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); G06N 20/00 (2019.01);
Abstract

Systems and methods are provided for implementing a parallel Expectation Minimization algorithm for generalized latent variable models. Item response data that is based on responses to items from multiple respondents is accessed. The item response data includes data for multiple response variables. The item response data is analyzed using a generalized latent variable model, and the analysis includes an application of a Parallel-E Parallel-M (PEPM) algorithm. In a parallel Expectation step of the PEPM algorithm, the respondents are subdivided into N groups of respondents, and computations for the N groups are performed in parallel using the N processor cores. In a parallel Maximization step of the PEPM algorithm, the response variables are subdivided into N groups of response variables, and computations for the N groups of response variables are performed in parallel using the N processor cores.


Find Patent Forward Citations

von Davier, Matthias. (2020). Parallel computing for data analysis using generalized latent variable models (U.S. Patent No. 10706188). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10706188

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…