The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Sep. 29, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Conrad M. Albrecht, Yorktown Heights, NY (US);

Marcus Freitag, Yorktown Heights, NY (US);

Theodore Van Kessel, Yorktown Heights, NY (US);

Siyuan Lu, Yorktown Heights, NY (US);

Hendrik F. Hamann, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/28 (2019.01); G06F 17/12 (2006.01); G06K 9/62 (2006.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/287 (2019.01); G06F 17/12 (2013.01); G06K 9/6218 (2013.01); G06F 16/2336 (2019.01);
Abstract

A method for clustering time stamps in time series data includes receiving a one-dimensional array of ordered timestamps and an expected frequency; determining a set of time intervals; determining a first binary array that indicates whether each time interval in the set of time intervals is greater than or less than the expected frequency; determining a second binary array of differences between a corresponding pair of adjacent elements of the first binary array; appending an ith timestamp to one of a set of opening interval bounds, a set of closing interval bounds, or a set of isolated points; merging the set of set of opening interval bounds and the set of closing interval bounds into a set of cluster intervals τ; and outputting the set of cluster intervals and the set of isolated points.


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