The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
May. 30, 2018
Applicant:
Oracle International Corporation, Redwood Shores, CA (US);
Inventors:
Hoyong Park, San Jose, CA (US);
Vitaly Bychkov, St. Petersburg, RU;
Assignee:
Oracle International Corporation, Redwood Shores, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 16/29 (2019.01); G06Q 10/04 (2012.01); G06Q 10/06 (2012.01); G01C 21/20 (2006.01); G01C 21/36 (2006.01); G08G 5/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G01C 21/203 (2013.01); G01C 21/3691 (2013.01); G06F 16/29 (2019.01); G06Q 10/047 (2013.01); G06Q 10/06 (2013.01); G08G 5/003 (2013.01);
Abstract
Systems and methods described herein are directed towards a test data generator. In some examples, a reference polygon may be received from an application. Additionally a control parameter may be received from the application. Two points on a map may be selected and a path between the two points may be generated. Additional points may be created along the path and test may be generated by processing the additional points. The test data may be provided to the application.