The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Sep. 28, 2018
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Shiri Gaber, Beer Sheva, IL;
Ohad Arnon, Beir Nir, IL;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Techniques are provided for system operational analytics using normalized likelihood scores. In one embodiment, an exemplary method comprises: obtaining data from data sources associated with a monitored system; applying at least one function to the log data to obtain a plurality of time-series counters for a plurality of distinct features within the data; processing the plurality of time-series counters using at least one machine learning model to obtain a plurality of log likelihood values representing a behavior of the monitored system over time; determining a z-score for each of the plurality of log likelihood values over a predefined short-term time window; monitoring a distribution of the z-scores for the plurality of log likelihood values over a predefined long-term time window to map the z-scores to percentile values; and mapping the percentile values to a health score for the monitored system based on predefined percentile ranges and/or a transformation function.