The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Apr. 04, 2019
Applicant:

Haworth, Inc., Holland, MI (US);

Inventors:

Diyu Liu, Fremont, CA (US);

Keefe Roedersheimer, Belmont, CA (US);

Satish Santhakumar, Fremont, CA (US);

Demian Entrekin, Oakland, CA (US);

Assignee:

Haworth, Inc., Holland, MI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 3/14 (2006.01); G09G 5/14 (2006.01); H04L 29/08 (2006.01); G06F 3/0488 (2013.01);
U.S. Cl.
CPC ...
G06F 3/1454 (2013.01); G06F 3/04883 (2013.01); G09G 5/14 (2013.01); H04L 65/403 (2013.01); H04L 67/18 (2013.01); H04L 67/22 (2013.01);
Abstract

A collaboration system including a spatial event map that can be published as an electronic document by a collaboration server and consumed by a consuming workstation. The electronic document is self-contained, and includes a viewer that has a module for rendering each of the graphical target types in the workspace onto a screen space. The system includes a server-side data processor that maintains the spatial event map which locates events in a workspace. The spatial event map includes a log of events, entries in the log having a location of a graphical target of the event in the workspace and a time.


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