The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Mar. 30, 2018
Qualcomm Incorporated, San Diego, CA (US);
ZhenQi Chen, South Boston, MA (US);
Jianguo Yao, Londonderry, NH (US);
Scott Davenport, Merrimack, NH (US);
Helena Deirdre O'Shea, San Diego, CA (US);
Reza Mohammadpourrad, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Systems, methods, and apparatus for internal on-chip clock calibration for devices coupled to a serial bus are described. A data line of the bus is monitored at a device in order to detect select command signals on the data line, where the select command signals have an accompanying clock signal, such as a burst clock, on a clock line of the serial bus sent concurrently with the command signal. The internal on-chip clock generator in the receiving device utilizes the clock signal occurring with the command signal for calibration, where the select signals are those signals sufficiently long enough for a receiving device to effectively utilize the concurrent clock signal for calibration purposes. In this manner, clock calibration for an internal clock is maintained accurately without the need for an extra clock calibration input.