The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Oct. 26, 2017
Applicant:
Omron Corporation, Kyoto-shi, Kyoto, JP;
Inventor:
Hiroshi Sawaragi, Otsu, JP;
Assignee:
OMRON Corporation, Kyoto-shi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/402 (2006.01); G05B 23/02 (2006.01); G05B 19/401 (2006.01); G05B 19/414 (2006.01); G01B 11/00 (2006.01); G01B 11/24 (2006.01); G01B 21/04 (2006.01); G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
G05B 19/402 (2013.01); G01B 11/005 (2013.01); G01B 11/0608 (2013.01); G01B 11/24 (2013.01); G01B 21/045 (2013.01); G05B 19/401 (2013.01); G05B 19/4145 (2013.01); G05B 23/0289 (2013.01); G01B 2210/50 (2013.01); G05B 2219/37193 (2013.01); G05B 2219/37345 (2013.01);
Abstract
A PLC system includes a displacement sensor, drives, and a PLC. When an unmeasurable condition is detected at a data obtaining position, the PLC system moves the displacement sensor back to the position at which the unmeasurable condition is detected, and again performs measurement. When an unmeasurable condition is detected again in the measurement, the PLC system SYS moves the stage to the next data obtaining position, and again performs measurement.