The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Jun. 02, 2017
Applicant:

Leica Microsystem Cms Gmbh, Wetzlar, DE;

Inventors:

Manuel Kremer, Leimen, DE;

Vishnu Vardhan Krishnamachari, Seeheim-Jugenheim, DE;

Arnold Giske, Sandhausen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/11 (2006.01); G02B 21/00 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
G02F 1/116 (2013.01); G02B 21/0032 (2013.01); G02B 21/06 (2013.01); G02F 1/113 (2013.01);
Abstract

A method for adjusting an intensity of a light beam in an optical arrangement includes passing the light beam through an acousto-optical tunable filter (AOTF). The intensity of the light beam is adjusted as a function of frequency and/or amplitude of a sound wave with which the AOTF is operated. The amplitude of the sound wave at a specified sound wave frequency is selected such that the amplitude is larger than would be required to achieve a first maximum diffraction efficiency for a specified wavelength or for a specified wavelength spectrum of the light beam. The amplitude of the sound wave is also selected such that a value of an integral of a product of the transmission function of the AOTF and the wavelength spectrum of the light beam is larger than at a value of the amplitude to be selected to achieve the first maximum.


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