The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Jun. 23, 2016
Applicant:

Kabushiki Kaisha Nihon Micronics, Tokyo, JP;

Inventors:

Yuki Sato, Tokyo, JP;

Kazuyuki Tsunokuni, Tokyo, JP;

Tomokazu Saito, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G01R 31/36 (2020.01); H01M 10/00 (2006.01); H01M 4/131 (2010.01); H01L 29/792 (2006.01); H01L 21/336 (2006.01); G01R 31/388 (2019.01); G01R 31/385 (2019.01); H01M 10/48 (2006.01); H01G 9/20 (2006.01); H01M 14/00 (2006.01); H01M 10/42 (2006.01);
U.S. Cl.
CPC ...
G01R 31/388 (2019.01); G01R 31/3865 (2019.01); H01G 9/2068 (2013.01); H01M 10/4285 (2013.01); H01M 10/48 (2013.01); H01M 14/005 (2013.01);
Abstract

An intermediate structure unit for a secondary cell according to the present invention is the intermediate structure unit for a secondary cell having a secondary cell and a test structure unit on a common substrate. Each of the secondary cell and the test structure unit includes a first electrode layer and a second electrode layer. A plurality of layers are layered at the secondary cell between the first electrode layer and the second electrode layer. The plurality of layers include at least a metal oxide semiconductor layer and a charging layer. A party of the plurality of layers is formed at the test structure unit between the first electrode layer and the second electrode layer.


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