The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Mar. 23, 2017
Applicant:

Ford Global Technologies, Llc, Dearborn, MI (US);

Inventors:

Xi Lu, Northville, MI (US);

Krishna Prasad Bhat, Belleville, MI (US);

Chingchi Chen, Ann Arbor, MI (US);

Zhuxian Xu, Novi, MI (US);

Guangyin Lei, Dearborn Heights, MI (US);

Assignee:

Ford Global Technologies, LLC, Dearborn, MI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 1/06 (2006.01); G01R 15/14 (2006.01); G01R 17/02 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06766 (2013.01); G01R 1/06 (2013.01); G01R 1/07307 (2013.01); G01R 15/146 (2013.01); G01R 17/02 (2013.01);
Abstract

A testing apparatus includes a holster including a jack defining a conductive periphery configured to connect with a reference lead of the voltage probe to form a common ground. The apparatus includes a shunt defining first and second regions of different potential having predetermined difference. The second region is configured to connect with a reference lead of the shunt probe. The apparatus includes a bridge configured to connect the shunt probe lead with the common ground.


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