The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
May. 31, 2017
Tech4imaging Llc, Columbus, OH (US);
Qussai Marashdeh, Columbus, OH (US);
Benjamin Straiton, Pataskala, OH (US);
Christopher Zuccarelli, Columbus, OH (US);
Tech4Imaging LLC, Columbus, OH (US);
Abstract
A system and method for imaging, monitoring, or measuring systems and processes utilizing only data provided from capacitance sensors. The present invention combines the multi-frequency method of both ECVT/AECVT and DCPT to image or measure processes and systems more efficiently and accurately than the methods alone. The present system analyzes capacitance and current phase acquired at multiple frequencies to determine a plurality of properties of single and multiphase systems all at once. The combined use of ECVT and DCPT in multiphase flow can also be extended to measure volume fraction and phase distribution of flows involving greater than three phases by using multiple frequencies for capacitance, current phase, or both.