The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Aug. 10, 2016
Applicant:
Mitsubishi Electric Corporation, Chiyoda-ku, Tokyo, JP;
Inventor:
Megumi Irie, Tokyo, JP;
Assignee:
MITSUBISHI ELECTRIC CORPORATION, Chiyoda-Ku, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01); G06T 1/00 (2006.01); G01N 21/954 (2006.01); G01N 21/88 (2006.01); G06T 7/00 (2017.01); G01S 13/88 (2006.01); G06T 1/60 (2006.01);
U.S. Cl.
CPC ...
G01B 11/30 (2013.01); G01N 21/88 (2013.01); G01N 21/954 (2013.01); G01S 13/88 (2013.01); G06T 1/00 (2013.01); G06T 1/60 (2013.01); G06T 7/0004 (2013.01); G06T 2207/10028 (2013.01);
Abstract
A detection device includes: a crack detection unit to detect a deformation on a surface of a structure from image information on the structure; a step detection unit to detect a step on the surface of the structure from three-dimensional point group information on the structure measured with a laser; and a determination unit to determine a state of the deformation using information on the deformation generated by the crack detection unit and information on the step generated by the step detection unit.