The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Jun. 12, 2018
Sightline Innovation Inc., Toronto, CA;
Wallace Trenholm, Toronto, CA;
Lorenzo Pons, Toronto, CA;
Sightline Innovation Inc., Toronto, CA;
Abstract
A system and method for surface inspection of an object using optical coherence tomography (OCT) is provided. The method includes determining a first working distance; determining a first depth of field, based on the first working distance; changing the depth of field to the first depth of field; performing an A-scan of the object; moving the object; determining a subsequent working distance; determining whether the object is in focus at the subsequent working distance, if the object is not in focus: determining a subsequent depth of field based on the subsequent working distance; changing the depth of field to the first depth of field; and performing an A-scan of the object; and otherwise, performing an A-scan of the object.