The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
Sep. 28, 2018
Siemens Aktiengesellschaft, Munich, CN;
Chuan Yu Zhang, Beijing, CN;
Yue Zhuo, Beijing, CN;
Dong Li, Beijing, CN;
Rui Gong Zhang, Munich, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
An embodiment relates to a curvature measurement apparatus. The apparatus includes a first curvature measurement unit configured to, upon a curvature of an object to be measured being relatively greater than a first curvature, measure the curvature of the object to be measured; and a second curvature measurement unit configured to, upon the curvature of the object to be measured being relatively smaller than a second curvature, measure the curvature of the object to be measured, the second curvature being relatively greater than or equal to the first curvature. The curvature measurement apparatus can improve an accuracy of a curvature of an object to be measured.