The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Sep. 28, 2015
Applicant:

Jx Nippon Mining & Metals Corporation, Tokyo, JP;

Inventors:

Takayuki Asano, Ibaraki, JP;

Kunihiro Oda, Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/34 (2006.01); C22C 27/00 (2006.01); C22C 27/02 (2006.01); C22C 27/04 (2006.01); C22C 27/06 (2006.01); C22C 14/00 (2006.01); C22C 22/00 (2006.01); C22C 19/07 (2006.01); C22C 5/04 (2006.01); C22C 19/03 (2006.01); C22C 1/04 (2006.01); H01J 37/34 (2006.01); C23C 14/16 (2006.01);
U.S. Cl.
CPC ...
C23C 14/3414 (2013.01); C22C 1/045 (2013.01); C22C 5/04 (2013.01); C22C 14/00 (2013.01); C22C 19/03 (2013.01); C22C 19/07 (2013.01); C22C 22/00 (2013.01); C22C 27/00 (2013.01); C22C 27/02 (2013.01); C22C 27/04 (2013.01); C22C 27/06 (2013.01); C23C 14/165 (2013.01); H01J 37/3426 (2013.01);
Abstract

Provided is a master alloy for a sputtering target, wherein, when elements constituting the master alloy are following X1, X2, Y1, Y2, Y2, and Y3; specifically, where X1 is one or two types of Ta or W; X2 is at least one type of Ru, Mo, Nb or Hf; Y1 is one or two types of Cr or Mn; Y2 is one or two types of Co or Ni; and Y3 is one or two types of Ti or V, the master alloy comprises any one combination of X1-Y1, X1-Y2, X1-Y3, X2-Y1, and X2-Y2 of the foregoing constituent elements. The present invention consequently yields superior effects of being able to obtain a sintered sputtering target with few defects and having a high-density and uniform alloy composition, and, by using this target, to realize the deposition of an alloy barrier film with uniform quality and few particles at a high speed.


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