The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 07, 2020
Filed:
May. 31, 2018
Welch Allyn, Inc., Skaneateles Falls, NY (US);
John A. Lane, Weedsport, NY (US);
David L. Kellner, Baldwinsville, NY (US);
Eric Joseph Laurin, Beaverton, OR (US);
Zachary K. Boronka, Camillus, NY (US);
Welch Allyn, Inc., Skaneateles Falls, NY (US);
Abstract
A system for conducting an examination of the eyes of a subject includes an examination instrument which emits light at infrared wavelengths, and a shield. The shield provides shielding of the subject's eyes from visible wavelengths. At least a portion of the shield is transparent to the infrared wavelengths emitted by the examination instrument. A related method of conducting an eye examination on a subject includes the step of providing a shield which is transparent to infrared wavelengths but nontransparent to visible wavelengths. The method also includes the step of carrying out the examination with an instrument which is located on the examiner facing side of the shield and which emits the infrared wavelengths to which the shield is transparent. One variant of the method determines parameters relating to the subject's eyes and/or vision using only information considered to be valid, validity being based on the subject's pupil diameter.