The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Dec. 28, 2018
Applicant:

Ricoh Company, Ltd., Tokyo, JP;

Inventors:

Jun Kishiwada, Kanagawa, JP;

Shin Aoki, Kanagawa, JP;

Naoki Kikuchi, Kanagawa, JP;

Kagehiro Nagao, Kanagawa, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Int. Cl.
CPC ...
H04N 13/246 (2018.01); G06T 7/80 (2017.01); H04N 13/239 (2018.01); B60R 11/04 (2006.01);
U.S. Cl.
CPC ...
H04N 13/246 (2018.05); B60R 11/04 (2013.01); G06T 7/85 (2017.01); H04N 13/239 (2018.05); G06T 2207/10016 (2013.01); G06T 2207/30208 (2013.01); G06T 2207/30252 (2013.01);
Abstract

A calibration method is for a photographic device that photographs an object through a transparent body. The calibration method includes: acquiring a first photographic image by photographing the object without interposing the transparent body; acquiring a second photographic image by photographing the object through the transparent body; calculating an absolute positional deviation that indicates a deviation in coordinates of an image of the object due to the transparent body based on coordinates of an image of the object on the first photographic image and coordinates of an image of the object on the second photographic image; calculating a correction parameter for calibrating the absolute positional deviation; and storing the correction parameter in the photographic device.


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