The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Feb. 23, 2018
Applicant:

Fraunhofer-gesellschaft Zur Förderung Der Angewandten Forschung E.v., München, DE;

Inventors:

Frank Wippermann, Meiningen, DE;

Andreas Brückner, Jena, DE;

Andreas Bräuer, Schlöben, DE;

Alexander Oberdörster, Jena, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/247 (2006.01); H04N 5/225 (2006.01); H04N 5/232 (2006.01); H04N 13/243 (2018.01);
U.S. Cl.
CPC ...
H04N 13/243 (2018.05); H04N 5/2258 (2013.01); H04N 5/23232 (2013.01); H04N 5/23238 (2013.01); H04N 5/247 (2013.01);
Abstract

A 3D multi-aperture imaging device that is, on the one hand, able to provide 3D information on a scene and, on the other hand, allows obtaining high lateral resolution and/or a wide total field of view, is described. The 3 D multi-aperture imaging device is provided with a first plurality of optical channels for projecting overlapping first partial fields of view of a total field of view on first image sensor areas of an image sensor of the 3D multi-aperture imaging device, as well as with a second plurality of optical channels for projecting overlapping second partial fields of view of the total field of view on second image sensor areas of the image sensor.


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