The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Apr. 18, 2019
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

John Hudlow, Richardson, TX (US);

Tuan M. Tong, Frisco, TX (US);

Assignee:

RAYTHEON COMPANY, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01); H03L 7/091 (2006.01);
U.S. Cl.
CPC ...
H03M 1/126 (2013.01); H03L 7/091 (2013.01);
Abstract

A control circuit for signal sampling of an analog RF signal includes: a spectrum monitoring circuit for monitoring the analog RF signal to determine a frequency of the analog RF signal; a tunable clock source for generating a tunable sampling clock for sampling the analog RF signal; a sample clock tuning circuit for controlling the tunable clock source and selecting a sample clock frequency of the tunable sampling clock that provides a predetermined ratio between the sample clock frequency of the tunable sampling clock and a center frequency of the analog RF signal; and an Analog-to-Digital Converter (ADC) for sampling the analog RF signal using the tunable sampling clock.


Find Patent Forward Citations

Loading…