The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Mar. 15, 2018
Applicant:

Microchip Technology Incorporated, Chandler, AZ (US);

Inventors:

Mel Hymas, Camas, WA (US);

James Walls, Mesa, AZ (US);

Sonu Daryanani, Tempe, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/11517 (2017.01); H01L 27/105 (2006.01); H01L 21/28 (2006.01); H01L 29/788 (2006.01); H01L 29/423 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 27/11517 (2013.01); H01L 27/1052 (2013.01); H01L 29/40114 (2019.08); H01L 29/42328 (2013.01); H01L 29/66825 (2013.01); H01L 29/7881 (2013.01); G11C 2216/02 (2013.01); G11C 2216/04 (2013.01); G11C 2216/10 (2013.01);
Abstract

A memory cell, e.g., a flash memory cell, includes a substrate, a flat-topped floating gate formed over the substrate, and a flat-topped oxide region formed over the flat-topped floating gate. The flat-topped floating gate may have a sidewall with a generally concave shape that defines an acute angle at a top corner of the floating gate, which may improve a program or erase efficiency of the memory cell. The flat-topped floating gate and overlying oxide region may be formed with without a floating gate thermal oxidation that forms a conventional 'football oxide.' A word line and a separate erase gate may be formed over the floating gate and oxide region. The erase gate may overlap the floating gate by a substantially greater distance than the word line overlaps the floating gate, which may allow the program and erase coupling to the floating gate to be optimized independently.


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