The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Dec. 07, 2018
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventor:

Mathias Hoernig, Erlangen, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/60 (2006.01); G06T 7/70 (2017.01); A61B 90/00 (2016.01); A61B 6/12 (2006.01);
U.S. Cl.
CPC ...
G06T 11/60 (2013.01); G06T 7/70 (2017.01); A61B 6/12 (2013.01); A61B 90/39 (2016.02); A61B 2090/3937 (2016.02); A61B 2090/3966 (2016.02); G06T 2207/10024 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10084 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/10128 (2013.01); G06T 2207/10132 (2013.01); G06T 2207/30204 (2013.01); G06T 2210/41 (2013.01);
Abstract

A method is disclosed for graphically depicting a marker which is applied to an examination object in an imaging system. In an embodiment, the position of the marker is ascertained by way of a first measuring method. An image of the examination object is provided on the basis of a second measuring method, in which image the position of a graphical object that represents the marker in the image is ascertained and depicted on the basis of the first measuring method.


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