The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Oct. 09, 2018
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Peter Chondro, Hsinchu County, TW;

Wei-Hao Lai, New Taipei, TW;

Pei-Jung Liang, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/593 (2017.01); G06T 7/10 (2017.01); G05D 1/02 (2020.01); G05D 1/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/593 (2017.01); G05D 1/0088 (2013.01); G05D 1/0251 (2013.01); G06T 7/10 (2017.01); G05D 2201/0213 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30252 (2013.01);
Abstract

In one of the exemplary embodiments, the disclosure is directed to a depth estimation apparatus including a first type of sensor for generating a first sensor data; a second type of sensor for generating a second sensor data; and a processor coupled to the first type of sensor and the second type of sensor and configured at least for: processing the first sensor data by using two stage segmentation algorithms to generate a first segmentation result and a second segmentation result; synchronizing parameters of the first segmentation result and parameters of the second sensor data to generate a synchronized second sensor data; fusing the first segmentation result, the synchronized second sensor data, and the second segmentation result by using two stage depth estimation algorithms to generate a first depth result and a second depth result.


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