The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Mar. 12, 2018
Fujifilm Corporation, Tokyo, JP;
Hirokazu Kondo, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are a feature impression axis determination system, a feature impression axis determination method, and a program thereof capable of determining a feature axis indicating features of a plurality of images. A plurality of images is input, and a standard impression value of each of the plurality of images is determined with respect to at least two standard impression axes. The determined standard impression values are plotted in a standard impression region. In the standard region defined by the two standard impression axes, an axis on which a variance of the standard impression values becomes a maximum is determined as a feature impression axis indicating features of the plurality of input images. The determined feature impression axis is displayed in the standard region.