The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Jul. 06, 2018
Siemens Healthcare Gmbh, Erlangen, DE;
Thomas Pheiffer, Philadelphia, PA (US);
Shun Miao, Princeton, NJ (US);
Rui Liao, Princeton Junction, NJ (US);
Pavlo Dyban, Berlin, DE;
Michael Suehling, Erlangen, DE;
Tommaso Mansi, Plainsboro, NJ (US);
Siemes Healthcare GmbH, Erlangen, DE;
Abstract
Systems and methods are provided for identifying pathological changes in follow up medical images. Reference image data is acquired. Follow up image data is acquired. A deformation field is generated for the reference image data and the follow up data using a machine-learned network trained to generate deformation fields describing healthy, anatomical deformation between input reference image data and input follow up image data. The reference image data and the follow up image data are aligned using the deformation field. The co-aligned reference image data and follow up image data are analyzed for changes due to pathological phenomena.