The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Apr. 21, 2017
Canon Kabushiki Kaisha, Tokyo, JP;
Shinjiro Hori, Yokohama, JP;
Tohru Ikeda, Yokohama, JP;
Tetsuya Suwa, Yokohama, JP;
Tomokazu Ishikawa, Yokohama, JP;
Wakako Tanaka, Inagi, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An image processing apparatus acquires a work inspection image by image-taking one inspection object, acquires a work reference image that is different from the work inspection image, generates an aligned image by arranging the work reference image at the periphery of the work inspection image and subjects the aligned image to singular portion detection processing to detect a singular portion in the aligned image. The singular portion detection processing is performed on a first work inspection image obtained by image-taking a first inspection object, subsequently the singular portion detection processing is performed on a second work inspection image obtained by image-taking, after the first inspection object, a second inspection object, and subsequently the singular portion detection processing is performed on a third work inspection image obtained by image-taking, after the second inspection object, a third inspection object.