The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
May. 06, 2016
Adobe Inc., San Jose, CA (US);
Sumeet Katariya, Madison, WI (US);
Yinlam Chow, San Mateo, CA (US);
Mohammad Ghavamzadeh, San Jose, CA (US);
Adobe Inc., San Jose, CA (US);
Abstract
Sequential hypothesis testing techniques are described, which involve testing sequences of increasingly larger number of samples until a winner is determined. In particular, sequential hypothesis testing techniques is based on whether a result of a statistic has reached statistical significance that defines a confidence level in the accuracy of the results. Sequential hypothesis testing also permits the user to 'peek' into the test through use of a user interface (e.g., dashboard) to monitor the test in real time as it is being run. Real time output of this information in a user interface as a part of sequential hypothesis testing may be leveraged in a variety of ways. In a first example, a user may make changes as the test is run. In another example, flexible execution is also made possible in that the test may continue to run even if initial accuracy guarantees have been met.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile