The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Dec. 06, 2017
Applicant:
Seagate Technology Llc, Cupertino, CA (US);
Inventors:
Assignee:
Seagate Technology LLC, Fremont, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06N 3/08 (2006.01); G11B 27/36 (2006.01); G11B 5/455 (2006.01); G11B 5/31 (2006.01); G11B 5/09 (2006.01);
U.S. Cl.
CPC ...
G06N 3/086 (2013.01); G06F 11/008 (2013.01); G11B 5/455 (2013.01); G11B 27/36 (2013.01); G11B 5/09 (2013.01); G11B 5/3116 (2013.01); G11B 5/3163 (2013.01); G11B 2220/2516 (2013.01);
Abstract
A method for testing and grading electronic devices includes receiving a set of testing data associated with an electronic device that is following a testing routine. Based on the set of testing data, the method includes computing a first performance metric of the electronic device by using a first artificial neural network and computing a second performance metric of the electronic device by using a second artificial neural network. Based on at least the first predicted performance metric and the second predicted performance metric, the method includes computing a grade for the electronic device.