The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Dec. 27, 2017
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Chuan-Wei Kuo, Taoyuan, TW;

Ming-Chih Kao, Taipei, TW;

Yu-Hsuan Pan, Taipei, TW;

Pang-Chieh Wang, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 21/00 (2013.01); G06F 21/62 (2013.01);
U.S. Cl.
CPC ...
G06F 21/6254 (2013.01);
Abstract

A data de-identification method, a data de-identification apparatus and a non-transitory computer readable storage medium executing the same are provided. Original data including an identification field, a condition field, and a record field is obtained. An event condition is obtained according to the condition field. From the original data, a plurality of event fragment sequences corresponding to each of a plurality of identification data and corresponding to the event condition are obtained according to the plurality of identification data in the identification field and the event condition. Sequence data is obtained according to the plurality of identification data and the plurality of event fragment sequences corresponding to each of the identification data. De-identification data is obtained by adjusting the sequence data.


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