The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Jul. 26, 2016
Institute of Automation, Chinese Academy of Sciences, Beijing, CN;
Institute of Automation, Chinese Academy of Sciences, Beijing, CN;
Abstract
A method for concurrent reading of mixed radix DFT/IDFT data, a method for concurrent calculation of mixed radix DFT/IDFT method, an apparatus for concurrent reading of mixed radix DFT/IDFT data, and an apparatus for concurrent calculation of mixed radix DFT/IDFT. The method for concurrent reading includes: configuring dual circulation parameters according to the number of points corresponding to the number of series to be computed and the number of points corresponding to the number of series accomplished; then, determining the value size between the maximum number of concurrently read data and the product of the number of points corresponding to the number of series accomplished; and based on the result of determination, calculating the dual circulation parameters corresponding thereto according to the result of determination, and concurrently reading data based on the calculated dual circulation parameters.