The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Nov. 06, 2017
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Sundar Rajan Raman, Tamil Nadu, IN;

Jeff L. Howard, Charlotte, NC (US);

Prasad L.v.k.d. Dasari, Charlotte, NC (US);

Lakshmikanth S. Nagapudi, Waxhaw, NC (US);

Padmanabham Ponnada, Charlotte, NC (US);

Assignee:

Bank of America Corporation, Charlotte, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G06F 9/445 (2018.01); G06F 16/25 (2019.01); G06F 8/36 (2018.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 8/36 (2013.01); G06F 9/44521 (2013.01); G06F 16/258 (2019.01);
Abstract

Systems for providing dynamic lineage validation are provided. A system may receive mapping data from a computing device. The mapping data may be formatted used to generate one or more libraries. In some examples, the libraries may be stored and used in development of future processes. In some examples, one or more controls related to the process, mapping data, and the like, may be received. The system may execute the controls to determine whether data violates the one or more of the controls. If so, the system may prevent the associated process from executing. If the data does not violate one or more controls, the system may cause the process to execute. After executing the process, run time events may be collected. The run time events may be linked to the mapping data and may be used to validate data quality, data lineage, data accuracy, and the like.


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