The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Jan. 18, 2018
Applicant:
SK Hynix Inc., Icheon-si Gyeonggi-do, KR;
Inventors:
Nam Hoon Kim, Seoul, KR;
Min Kyu Lee, Cheongju-si, KR;
Assignee:
SK hynix Inc., Icheon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G11C 16/10 (2006.01); H03M 13/15 (2006.01); G11C 29/52 (2006.01); H03M 13/19 (2006.01); G11C 16/04 (2006.01); H03M 13/11 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1044 (2013.01); G06F 11/102 (2013.01); G06F 11/1048 (2013.01); G06F 11/1056 (2013.01); G06F 11/1072 (2013.01); G11C 16/10 (2013.01); G11C 16/102 (2013.01); H03M 13/1585 (2013.01); G11C 16/0483 (2013.01); G11C 29/52 (2013.01); G11C 2029/0411 (2013.01); H03M 13/1102 (2013.01); H03M 13/152 (2013.01); H03M 13/1515 (2013.01); H03M 13/19 (2013.01);
Abstract
A method for operating a semiconductor memory device may include applying a program pulse for programming data of a first page included in the semiconductor memory device. The method may include determining whether the number of times of applying the program pulse has exceeded a first critical value. The method may include performing an error bit check on a second page coupled to the same word line as the first page, based on the determined result of whether the first critical value has been exceeded.