The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Oct. 08, 2018
Applicant:

Tableau Software, Inc., Seattle, WA (US);

Inventors:

Tyler Martin, Seattle, WA (US);

Jeannine Frazier Boone, Kenmore, WA (US);

Bora Beran, Bothell, WA (US);

Assignee:

Tableau Software, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/0484 (2013.01); G06F 16/2455 (2019.01); G06F 3/0482 (2013.01); G06F 16/25 (2019.01); G06F 16/248 (2019.01);
U.S. Cl.
CPC ...
G06F 3/04847 (2013.01); G06F 3/0482 (2013.01); G06F 16/248 (2019.01); G06F 16/2455 (2019.01); G06F 16/252 (2019.01);
Abstract

A process displays a data visualization user interface on a computing device. Using the user interface, a user selects a data set and a set of configuration parameters. The parameters selected include (i) a first data field from the data set to define a first axis of a two-dimensional data visualization and (ii) a second data field to define a second axis of the data visualization. When the user selects the first axis, the interface displays an axis configuration window. The user selects the symmetric log axis scaling option for the first axis. The device retrieves the data set from a database according to the configuration parameters. The device then generates and displays the data visualization according to the configuration parameters, including scaling the first axis of the data visualization using a symmetric log transformation function and displaying axis tick marks on the first axis according to the scaling.


Find Patent Forward Citations

Loading…