The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Nov. 11, 2016
Applicant:

Endress+hauser Process Solutions Ag, Reinach, CH;

Inventors:

Marc Baret, Kembs, FR;

Georg Hauss, Freiburg, DE;

Ulrich Kaiser, Basel, CH;

Michael Maneval, Schopfheim, DE;

Markus Nick, Kembs, FR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/00 (2006.01); G05B 19/418 (2006.01); G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41845 (2013.01); G05B 19/0426 (2013.01); G05B 2219/25428 (2013.01); G05B 2219/33331 (2013.01);
Abstract

The invention relates to a method and to a system for optimizing the operation of a plurality of field devices in an automation technology plant. The method comprises: ascertaining application information and device types of field devices, wherein the application information describes the application of the respective field device; classifying the application information and storing the classified application information; ascertaining parameter sets from each of the plurality of field devices, wherein the parameter sets comprise multiple parameters and each parameter is assigned a parameter value or a parameter value range, and each field device has at least one current parameter set and at least one standard parameter set, and storing the parameter sets; comparing the current parameter sets with the standard parameter sets to determine actually used parameters of a device type for an application; and operating the field device on the basis of the actually used parameters.


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