The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Mar. 14, 2019
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Embl European Molecular Biology Laboratory, Heidelberg, DE;
Frank Sieckmann, Bochum, DE;
Urban Liebel, Dielheim-Horrenberg, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
EMBL EUROPEAN MOLECULAR BIOLOGY LABORATORY, Heidelberg, DE;
Abstract
A microscopy system provides for scanning a sample by a microscope, which is at least in part electrically or electronically controllable and in which a plurality of images or digital images are generatable in a scanning operation at different times and/or different locations of the sample. The microscopy system includes a control computer configured to control the microscope, as well as further computers that are integratable into the microscopy system such that an adaptation of the microscopy system is possible dynamically and/or during the scanning operation using at least one of the further computers.