The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Aug. 09, 2017
Applicant:

Institut National D'optique, Québec, CA;

Inventor:

Simon Turbide, Québec, CA;

Assignee:

INSTITUT NATIONAL D'OPTIQUE, Quebec, Quebec, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/90 (2020.01); G01S 17/08 (2006.01);
U.S. Cl.
CPC ...
G01S 17/90 (2020.01); G01S 17/08 (2013.01);
Abstract

A method and a system are for three-dimensional (3D) synthetic aperture (SA) imaging. The method and system use spatial modulation on SA return signals as a function of their return angle distribution to account for local topography and provide 3D imaging capabilities. In some implementations, the method can involve a step of generating two spatially modulated two-dimensional (2D) SA images of a target region, each of which having a different spatial modulation profile, and a step of combining the two spatially modulated 2D SA images to obtain a 3D SA image. The 3D SA image can be used to determine an elevation map of the target region.


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