The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Aug. 24, 2018
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Martino Leghissa, Wiesenthau, DE;

Andreas Maier, Erlangen, DE;

Bernhard Stimpel, Erlangen, DE;

Christopher Syben, Cadolzburg, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01); G06T 11/00 (2006.01); G01R 33/56 (2006.01); G01R 33/561 (2006.01); A61B 6/00 (2006.01); A61B 6/02 (2006.01);
U.S. Cl.
CPC ...
G01R 33/482 (2013.01); G01R 33/4812 (2013.01); G01R 33/4818 (2013.01); G01R 33/4822 (2013.01); G01R 33/4824 (2013.01); G01R 33/4826 (2013.01); G01R 33/561 (2013.01); G01R 33/5608 (2013.01); G06T 11/006 (2013.01); A61B 6/027 (2013.01); A61B 6/5247 (2013.01); G06T 11/005 (2013.01); G06T 11/008 (2013.01);
Abstract

A method and a system for magnetic resonance imaging are provided. The method includes acquiring a magnetic resonance (MR) data set of an object by sampling only a portion of a k-space of the object. This sampled portion may be substantially triangle-shaped or be composed of multiple planes that extend through a point of origin of the k-space and are tangential to a common spherical cap in the k-space. An inverse Fourier transformation is then applied to the MR data set to transform the MR data set from the k-space to image space. A final MR image with a fan- or cone-beam geometry is then computed based on the transformed MR data set in image space.


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