The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
May. 21, 2019
Amazon Technologies, Inc., Seattle, WA (US);
Carlos Guillermo Parodi, Issaquah, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
A measurement system may measure a fractional time delay of transmission of a signal across a medium, such as a cable. The system may use a first clock to assist in creating and injecting an injected sequence (signal) into the medium. A second, slower clock may be used for sampling the sequence after transmission of the sequence through the medium. This causes a time Vernier scale effect that results in a sampled sequence that has a one-step skip for each instances of the sequence, where the sequence has N elements in the sequence. The location of the skip within the sequence will depend on the magnitude of the delay measured as a fraction of a clock period with a resolution of N. To measure this delay, a modified version of a pseudo-random sequence generator, capable of skipping one step, is used to determine the output.