The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Oct. 19, 2018
Applicant:

Texas Tech University System, Lubbock, TX (US);

Inventors:

David Weindorf, Lubbock, TX (US);

Delaina Pearson, Greenville, SC (US);

Somsubhra Chakraborty, West Bengal, IN;

Assignee:

Texas Tech University System, Lubbock, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01); G01N 33/24 (2006.01); G01N 23/223 (2006.01); G01N 21/359 (2014.01); G01J 3/44 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01N 33/246 (2013.01); G01J 3/4406 (2013.01); G01N 21/274 (2013.01); G01N 21/359 (2013.01); G01N 23/223 (2013.01); G01N 2223/076 (2013.01); G01N 2223/304 (2013.01); G01N 2223/33 (2013.01);
Abstract

An apparatus or method determines a salinity or metal content a liquid sample by scanning the liquid sample using a PXRF spectrometer, receiving a PXRF spectra from the PXRF spectrometer, baseline correcting and smoothing the received PXRF spectra, extracting a Kα emission line of one or more elements from the baseline corrected and smoothed PXRF spectra using only one beam from the PXRF spectrometer, determining the salinity or the metal content of the liquid sample using the one or more processors and a predictive model that relates the Kα emission line of the one or more elements to the salinity or the metal content of the liquid sample, and providing the salinity or the metal content of the liquid sample to the one or more input/output interfaces.


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