The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Jul. 02, 2015
Applicant:

Nanotech Analysis S.r.l., Turin, IT;

Inventors:

Gianpiero Mensa, Turin, IT;

Raffaele Correale, Turin, IT;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/72 (2006.01); H01J 49/00 (2006.01); H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
G01N 30/722 (2013.01); G01N 30/7206 (2013.01); H01J 49/0018 (2013.01); H01J 49/0427 (2013.01);
Abstract

A portable systemfor analyzing gaseous flows that vary over time is described, the system comprising a sampling chamber, a gas sampling module, an ion filtering moduleand an ion detecting module. The gas sampling moduleis configured to adjust an input gaseous flow Fi of gas particles from the sampling chamber, ionize said gas particles and to emit the produced ions, so as to generate an ion flow I. The ion filtering moduleis configured to controllably select at least one type of ion present in the ion flow I and to generate a corresponding at least one homogeneous ion beam I', having an intensity representative of the concentration of the corresponding gas particle in the gaseous composition to be analyzed. The ion detecting moduleis configured to measure the intensity of the at least one ion beam I′.


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