The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Jun. 13, 2017
Technische Universität München, Munich, DE;
TECHNISCHE UNIVERSITÄT MÜNCHEN, Munich, DE;
Abstract
The present invention relates to an X-ray tensor tomography (XTT) system (), comprising a source () for providing a beam with coherent X-rays, a first grating () with first grating lines and a second grating () with second grating lines, the second grating lines being parallel to the first grating lines and the XTT-system () being configured to relatively shift the first grating () and/or the second grating () in a shifting direction () being parallel to the planes of the gratings (), a stage () for rotating the specimen about a first axis of rotation and about not more than two axes of rotation (), the first axis of rotation lying in a plane () being tilted by an angle ψ with respect to the to the planes of the gratings (), wherein 0°<ψ≤90°, and by an angle β with respect to a plane being orthogonal to the direction of the beam path at a location of the stage (), wherein 0°<β<90°, a detector (), a reconstruction unit configured to reconstruct scattering tensors for a specimen.