The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 2020
Filed:
Oct. 07, 2016
Nederlandse Organisatie Voor Toegepast-natuurwetenschappelijk Onderzoek Tno, 's-Gravenhage, NL;
Bart Michiel de Boer, Rotterdam, NL;
Paul Louis Maria Joseph van Neer, Bergschenhoek, NL;
Peter Johan Harmsma, Vleuten, NL;
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO, 's-Gravenhage, NL;
Abstract
The present disclosure concerns a method and apparatus for measuring a sensor () comprising multiple optical resonators () optically connected to a single optical output interface (). The optical resonators () are interrogated with a light input signal (Si). A light output signal (So) is measured from the optic al output interface () to determine a combined spectral response (Sa) covering a wavelength range (W) including a plurality of resonance peaks (λ) for each of the optical resonators (). A Fourier transform spectrum (FT) of the combined spectral response (Sa) is calculated and a harmonic series of periodic peaks (n·f) is identified in the Fourier transform spectrum (FT). The harmonic series of periodic peaks is filtered to obtain a filtered Fourier transform spectrum (FT) and a sensor signal is calculated (X) based on the filtered Fourier transform spectrum (FT).