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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10697861 B1

PDFFull Text
Date of Patent:
Jun. 30, 2020

Filed:

Oct. 07, 2016

Structure abnormality detection device, structure abnormality detection method, storage medium, and structure abnormality detection system

Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Ryota Mase, Tokyo, JP;

Shinji Kasahara, Tokyo, JP;

Katsuhiro Ochiai, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Helen C Kwok

Int. Cl.
CPC ...
G01M 5/00 (2006.01); G01M 7/02 (2006.01); G01M 99/00 (2011.01); G01B 21/32 (2006.01); G01H 1/00 (2006.01); G01M 13/00 (2019.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01); G01B 21/32 (2013.01); G01H 1/00 (2013.01); G01M 5/0008 (2013.01); G01M 5/0033 (2013.01); G01M 7/02 (2013.01); G01M 13/00 (2013.01);
Abstract

A structure abnormality detection device that detects an abnormality of a structure includes means for storing a model that predicts, from a first inspection value acquired at a first inspection position, a second inspection value acquired at a second inspection position that is a position where a vibration intensity in vibration of a predetermined vibration mode at a natural frequency of the structure is substantially the same as at the first inspection position; and means for detecting an abnormality of the structure by evaluating fidelity of the first inspection value and the second inspection value acquired at a particular time to the model.

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Mase, Ryota. (2020). Structure abnormality detection device, structure abnormality detection method, storage medium, and structure abnormality detection system (U.S. Patent No. 10697861). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10697861

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